Shogo B. Kobayashi - Radiation hardness of a p-channel notch CCD

Journal article

Y. Kanemaru, J. Sato, K. Mori, H. Nakajima, Y. Nishioka, A. Takeda, K. Hayashida, H. Matsumoto, J. Iwagaki, K. Okazaki, K. Asakura, T. Yoneyama, H. Uchida, H. Okon, T. Tanaka, T. Tsuru, H. Tomida, T. Shimoi, T. Kohmura, K. Hagino, H. Murakami, S. Kobayashi, M. Yamauchi, I. Hatsukade, M. Nobukawa, K. Nobukawa, J. Hiraga, H. Uchiyama, K. Yamaoka, M. Ozaki, T. Dotani, H. Tsunemi, T. Hamano
Journal of Instrumentation, 2019

Semantic Scholar ArXiv DOI

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APA Click to copy
Kanemaru, Y., Sato, J., Mori, K., Nakajima, H., Nishioka, Y., Takeda, A., … Hamano, T. (2019). Radiation hardness of a p-channel notch CCD developed for the X-ray CCD camera onboard the XRISM satellite. Journal of Instrumentation.

Chicago/Turabian Click to copy
Kanemaru, Y., J. Sato, K. Mori, H. Nakajima, Y. Nishioka, A. Takeda, K. Hayashida, et al. “Radiation Hardness of a p-Channel Notch CCD Developed for the X-Ray CCD Camera Onboard the XRISM Satellite.” Journal of Instrumentation (2019).

MLA Click to copy
Kanemaru, Y., et al. “Radiation Hardness of a p-Channel Notch CCD Developed for the X-Ray CCD Camera Onboard the XRISM Satellite.” Journal of Instrumentation, 2019.

BibTeX Click to copy

@article{y2019a,
  title = {Radiation hardness of a p-channel notch CCD developed for the X-ray CCD camera onboard the XRISM satellite},
  year = {2019},
  journal = {Journal of Instrumentation},
  author = {Kanemaru, Y. and Sato, J. and Mori, K. and Nakajima, H. and Nishioka, Y. and Takeda, A. and Hayashida, K. and Matsumoto, H. and Iwagaki, J. and Okazaki, K. and Asakura, K. and Yoneyama, T. and Uchida, H. and Okon, H. and Tanaka, T. and Tsuru, T. and Tomida, H. and Shimoi, T. and Kohmura, T. and Hagino, K. and Murakami, H. and Kobayashi, S. and Yamauchi, M. and Hatsukade, I. and Nobukawa, M. and Nobukawa, K. and Hiraga, J. and Uchiyama, H. and Yamaoka, K. and Ozaki, M. and Dotani, T. and Tsunemi, H. and Hamano, T.}
}

Abstract

We report the radiation hardness of a p-channel CCD developed for the X-ray CCD camera onboard the XRISM satellite. This CCD has basically the same characteristics as the one used in the previous Hitomi satellite, but newly employs a notch structure of potential for signal charges by increasing the implant concentration in the channel . The new device was exposed up to approximately 7.9 × 1010 protons cm−2 at 100 MeV . The charge transfer inefficiency was estimated as a function of proton fluence with an 55Fe source. A device without the notch structure was also examined for comparison. The result shows that the notch device has a significantly higher radiation hardness than those without the notch structure including the device adopted for Hitomi. This proves that the new CCD is radiation tolerant for space applications with a sufficient margin.