APA   Click to copy
Miyake, K., Saito, S., Nakano, T., Hagino, K., Kobayashi, S., Okuda, K., … Takahashi, T. (2016). Effects on hard x-ray response of a double-sided Si strip detector caused by interstrip surface charge. Optical Engineering + Applications.

Chicago/Turabian   Click to copy
Miyake, Katsuma, S. Saito, T. Nakano, K. Hagino, S. Kobayashi, Kazufumi Okuda, T. Miura, et al. “Effects on Hard x-Ray Response of a Double-Sided Si Strip Detector Caused by Interstrip Surface Charge.” Optical Engineering + Applications (2016).

MLA   Click to copy
Miyake, Katsuma, et al. “Effects on Hard x-Ray Response of a Double-Sided Si Strip Detector Caused by Interstrip Surface Charge.” Optical Engineering + Applications, 2016.

@article{katsuma2016a,
  title = {Effects on hard x-ray response of a double-sided Si strip detector caused by interstrip surface charge},
  year = {2016},
  journal = {Optical Engineering + Applications},
  author = {Miyake, Katsuma and Saito, S. and Nakano, T. and Hagino, K. and Kobayashi, S. and Okuda, Kazufumi and Miura, T. and Sato, G. and Watanabe, S. and Kokubun, M. and Nakazawa, K. and Takeda, S. and Tajima, H. and Fukazawa, Y. and Takahashi, Tadayuki}
}